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NANOS

The NANOS SEM includes high-performance secondary electron (SE) and backscattered electron (BSE) detectors, along with integrated energy dispersive X-ray spectroscopy (EDX) for comprehensive elemental analysis. Additionally, it features a eucentric tilt stage, allowing precise control and maintaining focus during tilting, enhancing the examination of complex samples

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  • High-Performance Detectors: Equipped with Secondary Electron Detectors (SED) and Backscattered Electron Detectors (BSD) for detailed imaging.
  • Integrated EDX System: Allows for rapid elemental analysis, enhancing the versatility of the microscope.
  • Eucentric Tilt Stage: Ensures samples stay in focus during tilting, enabling precise imaging.
  • Robust and Compact Design: Suitable for various environments beyond traditional laboratories, thanks to its stability and small footprint.
  • User-Friendly Interface: Features both basic and advanced modes to accommodate users of all experience levels.
  • Low Vacuum Mode: Reduces charging effects in non-conductive samples, improving image quality.
  • Optimized Thermionic Source: Tungsten filament that can be user-replaced, reducing downtime and maintenance costs
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Sysmex Europe SE

Deelböge 19 D

22297 Hamburg

Germany

+49 (40) 527 26 0

+49 (40) 527 26 100

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NANOS

NANOS

A true analytical tabletop scanning electron microscope, the Nanos

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